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Code Coverage Measurement in Configurable Software Product Line Testing
Soobin Han, Jihyun Lee, Seoyeon Go KIPS Transactions on Software and Data Engineering,
Vol. 11, No. 7, pp. 273-282,
Jul.
2022
https://doi.org/10.3745/KTSDE.2022.11.7.273
Keywords: Configurable Software Product Line, Software Product Line Testing, Test Coverage Measurement, Code Coverage
https://doi.org/10.3745/KTSDE.2022.11.7.273
Keywords: Configurable Software Product Line, Software Product Line Testing, Test Coverage Measurement, Code Coverage
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